Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

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Application Note for Leica EM TIC 3X – Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphological studies. The information depth is just a few nm, therefore good sample preparation is very important to avoid damages.

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