Each Atom Counts: Protect Your Samples Prior to FIB Processing

http://www.leica-microsystems.com/science-lab/each-atom-counts-protect-your-samples-prior-to-fib-processing/

Application Note for Leica EM ACE600 – Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens with nanometer precision using a focused Ga+ ion beam.

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