Paper Samples – Sample Preparation for SEM

http://www.leica-microsystems.com/science-lab/paper-samples-sample-preparation-for-sem/

Application Note for Leica EM RES102 – A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard to its applicability. With the use of ion beam slope cutting a cross section of paper could be prepared. On the basis of this sample processing, it was possible to show the largely unaffected original structure of the thermally-sensitive paper in the scanning electron microscope.

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