Ultra-thin Carbon Support Films for Improved STEM-EELS Analysis of Nanoparticles

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Application Note for Leica EM ACE600 – Recent developments in aberration corrected transmission electron microscopes as well as further improvements in monochromaters and spectrometers have pushed the attainable energy resolution for Electron energy loss spectroscopy (EELS) to 100 meV and beyond. STEM-EELS of individual nanomaterials can be challenging due the necessity of a support film.

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